Invited Speech:

Synchrotron X-ray scattering based thin film solar cell studies

Prof. Xinhui Lu Assistant Professor Department of Physics, The Chinese University of Hong Kong, Shatin Hong Kong, P. R. China

Date: 12 Dec 2016 (Mon)
Time: 10:00 - 10:30am
Venue: TY Wong Hall, 5/F, Ho Sin Hang Engineering Building, CUHK

Abstract:

Nowadays, solar industry becomes the fastest growing industry due to the rising demands to solve energy crisis and environmental problems. Third generation solar cells such as organic, perovskite and CZTS solar cells are all relying on a semiconducting thin-film active layer to harvest the solar energy. The morphology of the active layer in terms of crystal structure, grain size and nanophase separation behavior is known to be critical to the solar cell device performance. Here, we are going to present our recent work on the active layer morphology and its correlations with device performances for several different types of photovoltaic systems. State-of-art synchrotron based X-ray scattering techniques are employed for the morphology characterization: grazing incidence wide-angle X-ray scattering (GIWAXS) for Angstrom-scale ordering and grazing incidence small-angle X-ray scattering (GISAXS) for nano-scale ordering.

About the speaker:

Xinhui Lu is currently an assistant professor in the Department of Physics in the Chinese University of Hong Kong. She received her BS degree in Physics from Nanjing University in 2004 and PhD degree in Physics from Yale University in 2010. After that, she served as a postdoctoral research associate at the Condensed Matter Physics and Materials Science Department of Brookhaven National Laboratory, USA for two years before joining in the Department of Physics in CUHK. Dr. Lu’s research interest lies in experimental soft condensed matter physics, including morphology and device performance of semiconducting organic materials, bulk and surface structure of functional thin films and synchrotron x-ray scattering techniques.